Contact
Mercedes-Benz AG
Leibnizstraße 2
71032 Böblingen
Journals and Conferences:
2022
- S. Kamm, S. Bickelhaupt, K. Sharma, N. Jazdi, I. Kallfass, and M. Weyrich, “Simulation-to-Reality based Transfer Learning for the Failure Analysis of SiC Power Transistors,” in 27th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Stuttgart, Germany, September 2022, 2022.
Research: -
Research portal: -